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Lab Manufacturers China

XRD

X 射线粉末衍射仪

XRD · X-Ray Analysis Instruments · 6 models

By Lab Manufacturers China Technical TeamLast reviewed Standards: USP <941> X-Ray Diffraction, ASTM E915 Verifying the alignment of X-ray diffraction instrumentation, ASTM D934 Identification of crystalline compounds in water-formed deposits

Standards referenced

  • USP <941> X-Ray Diffraction
  • ASTM E915 Verifying the alignment of X-ray diffraction instrumentation
  • ASTM D934 Identification of crystalline compounds in water-formed deposits
  • ISO 20203 Carbonaceous materials for aluminium production — XRD of calcined coke
  • ISO/IEC 17025
  • IEC 61010-2-091

What are XRD?

X-ray powder diffractometers identify and quantify crystalline phases by measuring how X-rays scatter from lattice planes. They serve pharmaceutical, cement, mineral, catalyst, battery and materials laboratories that need reliable structural information for research and quality control.

6 models of XRD

The 6 models below are current configurations; specifications are confirmed on quotation.

Benchtop Powder X-Ray Diffractometer

台式粉末 X 射线衍射仪

  • XRD-0001
  • XRD
  • CE (to be confirmed)
  • Radiation safety enclosure (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)
2-theta range:
3–160°
Angular accuracy:
±0.02°
X-ray tube power:
30–300 W
Detector:
position-sensitive or solid state
Measurement time:
3–15 min per sample
Sample changer:
optional 6 to 10 positions

A benchtop powder X-ray diffractometer is a compact, easy-to-use instrument for phase identification and routine quality control. It is chosen for laboratories that need reliable, routine diffraction data without a full-size research goniometer.

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High-Resolution Powder X-Ray Diffractometer

高分辨率粉末 X 射线衍射仪

  • XRD-0002
  • XRD
  • CE (to be confirmed)
  • Radiation safety enclosure (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)
2-theta range:
0–160°
Angular resolution:
< 0.05° FWHM
X-ray tube power:
1–3 kW
Monochromator:
incident-beam Ge or mirror
Goniometer radius:
240–320 mm
Detector:
solid-state or position-sensitive

A high-resolution powder X-ray diffractometer uses a long arm, precise goniometer and monochromatic optics for accurate data. It is chosen for routine lattice parameters, Rietveld refinement and demanding critical quantitative phase analysis.

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In-Situ X-Ray Diffractometer with Temperature Stage

带温度台的原位 X 射线衍射仪

  • XRD-0003
  • XRD
  • CE (to be confirmed)
  • Radiation safety enclosure (to be confirmed)
  • Pressure vessel conformance (to be confirmed)
Temperature range:
-190 to 1600 °C
Heating rate:
0.1–100 °C/min
Atmospheres:
air, inert, vacuum, reactive gas
2-theta range:
5–120° typical
Detector:
position-sensitive, fast
Scan time:
10 s to 5 min

An in-situ X-ray diffractometer adds a controlled sample environment so structural changes can be followed in real time. It is chosen for phase transitions, dehydration, sintering, catalysis, reaction and battery cycling studies.

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Micro-Focus X-Ray Diffractometer

微聚焦 X 射线衍射仪

  • XRD-0004
  • XRD
  • CE (to be confirmed)
  • Radiation safety enclosure (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)
Beam size:
10–200 µm
2-theta range:
0–90° with 2D detector
X-ray tube power:
30–100 W
Detector:
two-dimensional area detector
Sample stage:
x-y-z motorized
Alignment:
optical microscope or camera

A micro-focus X-ray diffractometer produces a narrow beam for small samples and localized analysis. It is chosen for single grains, inclusions, coatings, art objects and any specimen that must be measured in situ.

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Transmission Powder X-Ray Diffractometer

透射粉末 X 射线衍射仪

  • XRD-0005
  • XRD
  • CE (to be confirmed)
  • Radiation safety enclosure (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)
Geometry:
transmission capillary
Capillary diameter:
0.3–1.0 mm
2-theta range:
0–150°
Detector:
position-sensitive or area detector
Sample mass:
1–20 mg
X-ray tube power:
30–1500 W

A transmission powder X-ray diffractometer passes X-rays through a capillary or thin sample. It is chosen for weakly absorbing organic and pharmaceutical materials and for samples such as plate-like crystals prone to strong preferred orientation.

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Quantitative Phase Analysis X-Ray Diffractometer

定量物相分析 X 射线衍射仪

  • XRD-0006
  • XRD
  • CE (to be confirmed)
  • Radiation safety enclosure (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)
2-theta range:
5–120°
Angular accuracy:
±0.01°
X-ray tube power:
1–3 kW
Detector:
solid-state with wide linear range
Quantification methods:
Rietveld, internal standard, RIR
Amorphous determination:
internal standard method

A quantitative phase analysis X-ray diffractometer is optimized for reliable, accurate phase proportions using Rietveld refinement or reference intensity ratios. It is chosen routinely for cement, minerals, catalysts and multiphase complex industrial materials.

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Compare XRD models

Model2-theta rangeAngular accuracyX-ray tube powerDetectorMeasurement time
Benchtop Powder X-Ray DiffractometerXRD-00013–160°±0.02°30–300 Wposition-sensitive or solid state3–15 min per sample
High-Resolution Powder X-Ray DiffractometerXRD-00020–160°—1–3 kWsolid-state or position-sensitive10–120 min per scan
In-Situ X-Ray Diffractometer with Temperature StageXRD-00035–120° typical——position-sensitive, fast—
Micro-Focus X-Ray DiffractometerXRD-00040–90° with 2D detector—30–100 Wtwo-dimensional area detector1–30 min per point
Transmission Powder X-Ray DiffractometerXRD-00050–150°—30–1500 Wposition-sensitive or area detector5–60 min per scan
Quantitative Phase Analysis X-Ray DiffractometerXRD-00065–120°±0.01°1–3 kWsolid-state with wide linear range15–90 min per sample

Indicative values for this product class. Final specifications are confirmed on the quotation and in the calibration documents supplied with the instrument.

How do XRD work?

A focused X-ray beam, usually copper K-alpha radiation, strikes a powdered or polycrystalline sample. Crystal lattice planes scatter the beam, and constructive interference occurs at angles that satisfy Bragg's law, n times lambda equals two d sine theta. The detector records peak positions and intensities as the angle between the beam and the sample changes, producing a diffractogram. Peak positions reveal the lattice spacing and identify phases from reference databases, while peak intensities give relative phase amounts and peak widths relate to crystallite size and microstrain. Preferred orientation, sample displacement and fluorescence can distort results, so sample preparation and instrument alignment are critical. Modern instruments use theta-theta geometry, solid-state or position-sensitive detectors, and software for search-match, Rietveld refinement and profile analysis.

Which XRD variants are available?

  • Benchtop Powder X-Ray Diffractometer — A benchtop powder X-ray diffractometer is a compact, easy-to-use instrument for phase identification and routine quality control.
  • High-Resolution Powder X-Ray Diffractometer — A high-resolution powder X-ray diffractometer uses a long arm, precise goniometer and monochromatic optics for accurate data.
  • In-Situ X-Ray Diffractometer with Temperature Stage — An in-situ X-ray diffractometer adds a controlled sample environment so structural changes can be followed in real time.
  • Micro-Focus X-Ray Diffractometer — A micro-focus X-ray diffractometer produces a narrow beam for small samples and localized analysis.
  • Transmission Powder X-Ray Diffractometer — A transmission powder X-ray diffractometer passes X-rays through a capillary or thin sample.
  • Quantitative Phase Analysis X-Ray Diffractometer — A quantitative phase analysis X-ray diffractometer is optimized for reliable, accurate phase proportions using Rietveld refinement or reference intensity ratios.

How do I choose the right variant?

Select a powder diffractometer by resolution, detector type, sample environment and throughput. Benchtop instruments are compact and easy to use for phase identification and routine QC but have lower resolution and fewer accessories. High-resolution research systems use long arms, monochromators and high-precision goniometers for accurate lattice parameters, quantitative analysis and complex profile fitting. In-situ systems add heating, cooling, humidity or gas stages for time-resolved studies. Micro-focus instruments provide small beams for inclusions and small samples. Transmission geometry suits weakly absorbing organic and pharmaceutical materials and can reduce preferred orientation. Confirm the 2-theta range, angular resolution, sample changer capacity and software features such as Rietveld and PDF database access for your application.

Where are XRD used?

XRD are specified in pharmaceutical polymorph and crystallinity testing, cement, clinker and mineral phase analysis, catalyst, battery and ceramic materials and corrosion products and failure analysis.

Which standards and certifications apply?

Work with XRD is commonly governed by USP <941> X-Ray Diffraction, ASTM E915 Verifying the alignment of X-ray diffraction instrumentation, ASTM D934 Identification of crystalline compounds in water-formed deposits, ISO 20203 Carbonaceous materials for aluminium production — XRD of calcined coke, ISO/IEC 17025 and IEC 61010-2-091. Instrument certifications such as CE marking are confirmed per configuration and never assumed.

What are the key considerations before purchase?

X-ray diffraction instruments are regulated radiation devices and require shielding, interlocks, radiation surveys and trained operators. Powder samples must be ground finely and packed reproducibly, because particle size, packing density and preferred orientation bias peak intensities; back-loading, side-loading or spinning stages reduce orientation effects. Sample fluorescence from iron, cobalt or manganese samples raises background with copper radiation, which may require an alternative wavelength or a monochromator. Alignment, zero-offset and instrument profile are verified with standards such as silicon or corundum. Detectors and X-ray tubes are wear items, and goniometer calibration should be checked periodically. Keep sample preparation records for method traceability.

Frequently asked questions about XRD

Grind the sample to a fine, uniform powder, then pack it into a holder by back-loading or side-loading so the surface is flat and level with the holder edge. Spinning or using a zero-background holder reduces preferred orientation and background. Preparation quality strongly affects relative peak intensities.

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