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Lab Manufacturers China

XRF

X 射线荧光光谱仪

XRF · X-Ray Analysis Instruments · 5 models

By Lab Manufacturers China Technical TeamLast reviewed Standards: ASTM E1621 Wavelength dispersive X-ray fluorescence, ASTM D4294 Sulfur in petroleum products by EDXRF, ISO 3497 Metallic coatings — X-ray spectrometric thickness

Standards referenced

  • ASTM E1621 Wavelength dispersive X-ray fluorescence
  • ASTM D4294 Sulfur in petroleum products by EDXRF
  • ISO 3497 Metallic coatings — X-ray spectrometric thickness
  • IEC 62321 Determination of restricted substances in electrotechnical products
  • US EPA Method 6200 Field portable XRF for soil
  • ISO 13196 Soil quality — Screening of selected elements by EDXRF
  • IEC 61010-2-091
  • ISO/IEC 17025

What are XRF?

X-ray fluorescence spectrometers measure the characteristic X-rays emitted by atoms excited with a primary X-ray beam. They determine elemental composition from sodium to uranium in solids, powders, liquids and films with minimal sample preparation.

5 models of XRF

The 5 models below are current configurations; specifications are confirmed on quotation.

Energy-Dispersive X-Ray Fluorescence Spectrometer

能量色散 X 射线荧光光谱仪

  • XRF-0001
  • XRF
  • CE (to be confirmed)
  • Radiation safety enclosure (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)
Element range:
Na to U (Mg to U in air)
Detection limit:
1–100 mg/kg typical
X-ray tube power:
10–50 W
Detector:
silicon drift detector
Measurement time:
30–300 s
Sample types:
solids, powders, liquids, films

An energy-dispersive XRF spectrometer measures photon energies directly with a semiconductor detector and records the entire spectrum at once. It is the fast, compact workhorse for routine multi-element screening and quality control.

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Wavelength-Dispersive X-Ray Fluorescence Spectrometer

波长色散 X 射线荧光光谱仪

  • XRF-0002
  • XRF
  • CE (to be confirmed)
  • Radiation safety enclosure (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)
Element range:
Be or B to U
Detection limit:
0.1–10 mg/kg typical
Analyzing crystals:
LiF, PET, Ge and others
X-ray tube power:
1–4 kW
Measurement time:
1–20 min per sample
Atmosphere:
vacuum or helium

A wavelength-dispersive XRF spectrometer uses analyzing crystals to diffract selected wavelengths for very high resolution. It is chosen for routine precise major-element and light-element analysis and for the lowest XRF trace detection limits.

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Total Reflection X-Ray Fluorescence Spectrometer

全反射 X 射线荧光光谱仪

  • XRF-0003
  • XRF
  • CE (to be confirmed)
  • Radiation safety enclosure (to be confirmed)
  • Cleanroom compatibility (to be confirmed)
Element range:
Na to U
Detection limit:
picogram to nanogram range
Sample volume:
1–50 µL
Incidence angle:
below critical angle, < 0.1°
Carrier:
polished quartz or silicon wafer
Excitation:
X-ray tube or synchrotron

A total reflection XRF spectrometer measures tiny sample residues on a flat carrier at grazing incidence. It is chosen for ultratrace analysis of small sample volumes in semiconductor, water and biological work.

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Micro X-Ray Fluorescence Spectrometer

微区 X 射线荧光光谱仪

  • XRF-0004
  • XRF
  • CE (to be confirmed)
  • Radiation safety enclosure (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)
Spot size:
10–100 µm
Element range:
Na to U
Detection limit:
10–1000 mg/kg typical
Stage travel:
up to 100 × 100 mm
Stage resolution:
1 µm
X-ray tube power:
30–100 W

A micro-XRF spectrometer focuses the X-ray beam to a small spot for spatially resolved elemental analysis. It is chosen for microscopic inclusions, coatings, multilayers, forensic traces and heterogeneous samples in materials research.

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Polarized Energy-Dispersive X-Ray Fluorescence Spectrometer

偏振能量色散 X 射线荧光光谱仪

  • XRF-0005
  • XRF
  • CE (to be confirmed)
  • Radiation safety enclosure (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)
Element range:
Na to U
Detection limit:
0.1–10 mg/kg typical
Excitation:
polarized, secondary target
X-ray tube power:
100–400 W
Detector:
silicon drift or Si(Li)
Measurement time:
300–1800 s

A polarized energy-dispersive XRF spectrometer uses polarized excitation to strongly suppress scatter background. It is chosen for routine trace-element analysis of a wide range of environmental, geological and biological samples using a low-cost energy-dispersive system.

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Compare XRF models

ModelElement rangeDetection limitX-ray tube powerDetectorMeasurement time
Energy-Dispersive X-Ray Fluorescence SpectrometerXRF-0001Na to U (Mg to U in air)1–100 mg/kg typical10–50 Wsilicon drift detector30–300 s
Wavelength-Dispersive X-Ray Fluorescence SpectrometerXRF-0002Be or B to U0.1–10 mg/kg typical1–4 kW—1–20 min per sample
Total Reflection X-Ray Fluorescence SpectrometerXRF-0003Na to Upicogram to nanogram range—silicon drift or Si(Li)100–1000 s
Micro X-Ray Fluorescence SpectrometerXRF-0004Na to U10–1000 mg/kg typical30–100 Wsilicon drift detector—
Polarized Energy-Dispersive X-Ray Fluorescence SpectrometerXRF-0005Na to U0.1–10 mg/kg typical100–400 Wsilicon drift or Si(Li)300–1800 s

Indicative values for this product class. Final specifications are confirmed on the quotation and in the calibration documents supplied with the instrument.

How do XRF work?

A primary X-ray beam from a tube or radioisotope source ejects inner-shell electrons from sample atoms. Electrons from higher shells fall into the vacancies and emit X-ray photons whose energies equal the difference between the two levels, which is unique to each element. The intensity of each characteristic line is proportional to the amount of that element, so calibration with reference materials gives concentration. Energy-dispersive instruments use a semiconductor detector such as silicon drift to measure photon energies directly and record the whole spectrum at once. Wavelength-dispersive instruments use analyzing crystals to diffract specific wavelengths to a detector, giving better resolution and lower detection limits, especially for light elements. Matrix effects from absorption and secondary excitation are corrected by fundamental parameters or empirical influence coefficients, and sample form is matched to calibration standards.

Which XRF variants are available?

  • Energy-Dispersive X-Ray Fluorescence Spectrometer — An energy-dispersive XRF spectrometer measures photon energies directly with a semiconductor detector and records the entire spectrum at once.
  • Wavelength-Dispersive X-Ray Fluorescence Spectrometer — A wavelength-dispersive XRF spectrometer uses analyzing crystals to diffract selected wavelengths for very high resolution.
  • Total Reflection X-Ray Fluorescence Spectrometer — A total reflection XRF spectrometer measures tiny sample residues on a flat carrier at grazing incidence.
  • Micro X-Ray Fluorescence Spectrometer — A micro-XRF spectrometer focuses the X-ray beam to a small spot for spatially resolved elemental analysis.
  • Polarized Energy-Dispersive X-Ray Fluorescence Spectrometer — A polarized energy-dispersive XRF spectrometer uses polarized excitation to strongly suppress scatter background.

How do I choose the right variant?

Select an XRF configuration by element range, detection limit and sample type. Energy-dispersive instruments are compact, fast and well suited to routine screening and multi-element analysis, with moderate resolution. Wavelength-dispersive instruments cost more and are slower but excel for light elements, precise major-oxide analysis and low detection limits. Total reflection instruments reach ultratrace levels on small sample spots and serve semiconductor, water and biological analysis. Polarized energy-dispersive instruments lower background for trace work without the cost of wavelength dispersive optics. Micro-XRF adds spatial resolution for inclusions, coatings and forensic samples. Consider sample size, whether vacuum or helium purge is needed for light elements, automation level and the regulatory method your laboratory must follow before deciding.

Where are XRF used?

XRF are specified in elemental analysis of alloys, ceramics and glass, roHS and restricted substance screening, coating thickness and thin-film composition and cement, mining and geological sample analysis.

Which standards and certifications apply?

Work with XRF is commonly governed by ASTM E1621 Wavelength dispersive X-ray fluorescence, ASTM D4294 Sulfur in petroleum products by EDXRF, ISO 3497 Metallic coatings — X-ray spectrometric thickness, IEC 62321 Determination of restricted substances in electrotechnical products, US EPA Method 6200 Field portable XRF for soil, ISO 13196 Soil quality — Screening of selected elements by EDXRF, IEC 61010-2-091 and ISO/IEC 17025. Instrument certifications such as CE marking are confirmed per configuration and never assumed.

What are the key considerations before purchase?

XRF instruments are regulated radiation devices, so installation requires shielding, interlocks, radiation surveys and trained operators, with portable units also needing safe work procedures. Sample preparation strongly affects accuracy: surface contamination, insufficient thickness and particle size effects bias results, and powders are best pressed or fused. Calibration must match the sample matrix, and drift is monitored with check standards. Vacuum or helium systems need clean seals and gas supplies for light elements. Detector windows and X-ray tubes are wear parts with finite life. Keep records of tube hours, calibration and checks, and dispose of X-ray components according to radiation regulations.

Frequently asked questions about XRF

EDXRF measures photon energies directly with a semiconductor detector and records the whole spectrum simultaneously, giving speed and a compact design. WDXRF uses analyzing crystals to diffract selected wavelengths and offers higher resolution, better light-element performance and lower detection limits at higher cost and longer measurement times.

Need help specifying XRF?

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