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Benchtop Powder X-Ray Diffractometer — product photo

Benchtop Powder X-Ray Diffractometer

台式粉末 X 射线衍射仪

  • SKU XRD-0001
  • XRD
  • CE (to be confirmed)
  • Radiation safety enclosure (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)

Price on request — FOB / CIF quoted per order

Prices depend on configuration, quantity and destination port.

Key specifications

Key specifications
2-theta range3–160°
Angular accuracy±0.02°
X-ray tube power30–300 W
Detectorposition-sensitive or solid state
Measurement time3–15 min per sample
Sample changeroptional 6 to 10 positions
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By Lab Manufacturers China Technical TeamLast reviewed Standards: USP <941> X-Ray Diffraction, ASTM E915 Verifying the alignment of X-ray diffraction instrumentation, ASTM D934 Identification of crystalline compounds in water-formed deposits

What is the Benchtop Powder X-Ray Diffractometer?

A benchtop powder X-ray diffractometer is a compact, easy-to-use instrument for phase identification and routine quality control. It is chosen for laboratories that need reliable, routine diffraction data without a full-size research goniometer.

What is the Benchtop Powder X-Ray Diffractometer?

A benchtop powder X-ray diffractometer is a compact, easy-to-use instrument for phase identification and routine quality control. It is chosen for laboratories that need reliable, routine diffraction data without a full-size research goniometer.

Overview

This instrument packages a low-power X-ray tube, a compact theta-theta goniometer and a position-sensitive or solid-state detector in a single enclosure. Typical 2-theta ranges cover 3 to 160 degrees with angular accuracy sufficient for phase identification and semi-quantitative analysis. Measurement of a sample takes a few minutes, and an optional changer handles multiple samples for routine throughput. Software includes search-match against structure databases and simple quantification. Resolution is lower than research systems, and high-precision lattice parameters or complex profile fitting are limited, but the instrument is well suited to incoming material checks, polymorph screening at a basic level, cement and mineral phase identification and teaching. Interlocks and shielding provide radiation safety in a small footprint.

How does it work?

A focused X-ray beam, usually copper K-alpha radiation, strikes a powdered or polycrystalline sample. Crystal lattice planes scatter the beam, and constructive interference occurs at angles that satisfy Bragg's law, n times lambda equals two d sine theta. The detector records peak positions and intensities as the angle between the beam and the sample changes, producing a diffractogram. Peak positions reveal the lattice spacing and identify phases from reference databases, while peak intensities give relative phase amounts and peak widths relate to crystallite size and microstrain. Preferred orientation, sample displacement and fluorescence can distort results, so sample preparation and instrument alignment are critical. Modern instruments use theta-theta geometry, solid-state or position-sensitive detectors, and software for search-match, Rietveld refinement and profile analysis.

What are the key features?

  • Compact theta-theta goniometer with enclosed tube
  • 2-theta range of about 3 to 160 degrees
  • Position-sensitive or solid-state detector
  • Search-match software with structure databases
  • Optional multi-sample changer
  • Radiation interlocks in a bench footprint

What are the technical specifications?

A typical benchtop powder x-ray diffractometer configuration offers 2-theta range of 3–160°, angular accuracy of ±0.02°, X-ray tube power of 30–300 W, detector of position-sensitive or solid state, measurement time of 3–15 min per sample and sample changer of optional 6 to 10 positions. Values are indicative of the product class; the exact figures for each configuration are confirmed on the quotation and the calibration documents supplied with the instrument.

Which applications is it used for?

The Benchtop Powder X-Ray Diffractometer is used in incoming material and phase identification, cement, clinker and mineral analysis, basic polymorph and crystallinity checks and teaching and small-laboratory research. Across the wider XRD class, laboratories also deploy it for pharmaceutical polymorph and crystallinity testing, cement, clinker and mineral phase analysis and catalyst, battery and ceramic materials.

Which standards and certifications apply?

Relevant standards and methods include USP <941> X-Ray Diffraction, ASTM E915 Verifying the alignment of X-ray diffraction instrumentation, ASTM D934 Identification of crystalline compounds in water-formed deposits, ISO 20203 Carbonaceous materials for aluminium production — XRD of calcined coke, ISO/IEC 17025 and IEC 61010-2-091. Certification candidates for this model are CE, Radiation safety enclosure and ISO 9001 manufacturing; each is to be confirmed for the specific configuration before shipment, and certificates are supplied only where they have been issued.

X-ray diffraction instruments are regulated radiation devices and require shielding, interlocks, radiation surveys and trained operators. Powder samples must be ground finely and packed reproducibly, because particle size, packing density and preferred orientation bias peak intensities; back-loading, side-loading or spinning stages reduce orientation effects. Sample fluorescence from iron, cobalt or manganese samples raises background with copper radiation, which may require an alternative wavelength or a monochromator. Alignment, zero-offset and instrument profile are verified with standards such as silicon or corundum. Detectors and X-ray tubes are wear items, and goniometer calibration should be checked periodically. Keep sample preparation records for method traceability.

How do I select the right Benchtop Powder X-Ray Diffractometer?

Select a benchtop diffractometer for phase identification and routine QC when full research resolution and extensive sample environments are not required. Specify the 2-theta range, sample types and throughput. Confirm that the software includes databases and quantification tools for your phases.

How does it compare with other XRD variants?

Select a powder diffractometer by resolution, detector type, sample environment and throughput. Benchtop instruments are compact and easy to use for phase identification and routine QC but have lower resolution and fewer accessories. High-resolution research systems use long arms, monochromators and high-precision goniometers for accurate lattice parameters, quantitative analysis and complex profile fitting. In-situ systems add heating, cooling, humidity or gas stages for time-resolved studies. Micro-focus instruments provide small beams for inclusions and small samples. Transmission geometry suits weakly absorbing organic and pharmaceutical materials and can reduce preferred orientation. Confirm the 2-theta range, angular resolution, sample changer capacity and software features such as Rietveld and PDF database access for your application.

Full specifications

Full specifications
2-theta range3–160°
Angular accuracy±0.02°
X-ray tube power30–300 W
Detectorposition-sensitive or solid state
Measurement time3–15 min per sample
Sample changeroptional 6 to 10 positions
RadiationCu K-alpha
Geometrytheta-theta
Enclosureshielded with interlocks
InterfaceEthernet / USB

Indicative values for this product class. Final specifications are confirmed on the quotation and in the calibration documents supplied with the instrument.

Applications

  • Incoming material and phase identification
  • Cement, clinker and mineral analysis
  • Basic polymorph and crystallinity checks
  • Teaching and small-laboratory research

Key features

  • Compact theta-theta goniometer with enclosed tube
  • 2-theta range of about 3 to 160 degrees
  • Position-sensitive or solid-state detector
  • Search-match software with structure databases
  • Optional multi-sample changer
  • Radiation interlocks in a bench footprint

Frequently asked questions about Benchtop Powder X-Ray Diffractometer

Yes, it can perform semi-quantitative and, for many mixtures, quantitative analysis using reference intensity ratios or basic Rietveld refinement, provided sample preparation is good. Lower resolution and simpler detectors increase uncertainty for overlapping peaks, so complex quantification may need a higher-resolution instrument.

Related models

All XRD

Request a quotation for the Benchtop Powder X-Ray Diffractometer

Send your configuration, quantity and destination port to sales@labmanufacturerschina.com; we reply with a specification sheet and price.

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