Micro-Focus X-Ray Diffractometer

What is the Micro-Focus X-Ray Diffractometer?

A micro-focus X-ray diffractometer produces a narrow beam for small samples and localized analysis. It is chosen for single grains, inclusions, coatings, art objects and any specimen that must be measured in situ.

Overview

Focusing optics such as a polycapillary or multilayer mirror concentrate the X-ray beam to tens or hundreds of micrometres, and a motorized stage and optical microscope position the sample precisely. The instrument can measure a single crystal, a small inclusion, a coating layer or a fragment of an artefact without removing it, which is valuable in geology, archaeology and forensics. A two-dimensional detector collects Debye rings and single-crystal reflections quickly, and software indexes phases and maps crystallinity across a surface. Because the beam is small, counting times are longer and particle statistics can be poor for powders, but spatial information compensates. Sample positioning accuracy and beam stability determine the quality of micro-analysis.

How does it work?

A focused X-ray beam, usually copper K-alpha radiation, strikes a powdered or polycrystalline sample. Crystal lattice planes scatter the beam, and constructive interference occurs at angles that satisfy Bragg's law, n times lambda equals two d sine theta. The detector records peak positions and intensities as the angle between the beam and the sample changes, producing a diffractogram. Peak positions reveal the lattice spacing and identify phases from reference databases, while peak intensities give relative phase amounts and peak widths relate to crystallite size and microstrain. Preferred orientation, sample displacement and fluorescence can distort results, so sample preparation and instrument alignment are critical. Modern instruments use theta-theta geometry, solid-state or position-sensitive detectors, and software for search-match, Rietveld refinement and profile analysis.

What are the key features?

• Focusing optics producing a beam of tens of micrometres
• Motorized stage with optical microscope alignment
• Two-dimensional detector for fast data collection
• Analysis of single grains, inclusions and coatings
• Non-destructive measurement of artefacts
• Software for phase indexing and crystallinity maps

What are the technical specifications?

A typical micro-focus x-ray diffractometer configuration offers beam size of 10–200 µm, 2-theta range of 0–90° with 2D detector, X-ray tube power of 30–100 W, detector of two-dimensional area detector, sample stage of x-y-z motorized and alignment of optical microscope or camera. Values are indicative of the product class; the exact figures for each configuration are confirmed on the quotation and the calibration documents supplied with the instrument.

Which applications is it used for?

The Micro-Focus X-Ray Diffractometer is used in mineral grains and fluid inclusions, art, archaeology and heritage objects, coatings, thin layers and corrosion products and forensic and small evidence samples. Across the wider XRD class, laboratories also deploy it for pharmaceutical polymorph and crystallinity testing, cement, clinker and mineral phase analysis and catalyst, battery and ceramic materials.

Which standards and certifications apply?

Relevant standards and methods include USP <941> X-Ray Diffraction, ASTM E915 Verifying the alignment of X-ray diffraction instrumentation, ASTM D934 Identification of crystalline compounds in water-formed deposits, ISO 20203 Carbonaceous materials for aluminium production — XRD of calcined coke, ISO/IEC 17025 and IEC 61010-2-091. Certification candidates for this model are CE, Radiation safety enclosure and ISO 9001 manufacturing; each is to be confirmed for the specific configuration before shipment, and certificates are supplied only where they have been issued.

X-ray diffraction instruments are regulated radiation devices and require shielding, interlocks, radiation surveys and trained operators. Powder samples must be ground finely and packed reproducibly, because particle size, packing density and preferred orientation bias peak intensities; back-loading, side-loading or spinning stages reduce orientation effects. Sample fluorescence from iron, cobalt or manganese samples raises background with copper radiation, which may require an alternative wavelength or a monochromator. Alignment, zero-offset and instrument profile are verified with standards such as silicon or corundum. Detectors and X-ray tubes are wear items, and goniometer calibration should be checked periodically. Keep sample preparation records for method traceability.

How do I select the right Micro-Focus X-Ray Diffractometer?

Select a micro-focus diffractometer when only a tiny sample is available or when the measurement point must be located precisely within a larger object, as in geology, heritage and forensics. Specify the beam size, stage travel and detector type. Confirm that the software can index phases from two-dimensional images.

How does it compare with other XRD variants?

Select a powder diffractometer by resolution, detector type, sample environment and throughput. Benchtop instruments are compact and easy to use for phase identification and routine QC but have lower resolution and fewer accessories. High-resolution research systems use long arms, monochromators and high-precision goniometers for accurate lattice parameters, quantitative analysis and complex profile fitting. In-situ systems add heating, cooling, humidity or gas stages for time-resolved studies. Micro-focus instruments provide small beams for inclusions and small samples. Transmission geometry suits weakly absorbing organic and pharmaceutical materials and can reduce preferred orientation. Confirm the 2-theta range, angular resolution, sample changer capacity and software features such as Rietveld and PDF database access for your application.