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Lab Manufacturers China

ICP-OES

电感耦合等离子体发射光谱仪

ICO · ICP Spectrometers · 6 models

By Lab Manufacturers China Technical TeamLast reviewed Standards: USP <730> Plasma Spectrochemistry, USP <233> Elemental Impurities — Procedures, ICH Q3D Elemental Impurities

Standards referenced

  • USP <730> Plasma Spectrochemistry
  • USP <233> Elemental Impurities — Procedures
  • ICH Q3D Elemental Impurities
  • ISO 11885 Water quality — ICP-OES determination of elements
  • US EPA Method 200.7
  • ASTM D5185
  • ISO/IEC 17025

What are ICP-OES?

ICP-OES spectrometers measure the light emitted by atoms and ions excited in an inductively coupled argon plasma. They provide simultaneous multi-element analysis from microgram per litre to percent levels for environmental, pharmaceutical, food, metallurgical and geological laboratories.

6 models of ICP-OES

The 6 models below are current configurations; specifications are confirmed on quotation.

Radial-View ICP-OES Spectrometer

径向观测电感耦合等离子体发射光谱仪

  • ICO-0001
  • ICP-OES
  • CE (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)
  • IEC 61010-1 safety compliance (to be confirmed)
Wavelength range:
165–900 nm
Viewing mode:
radial
Optical resolution:
≤ 0.009 nm at 200 nm
Detection limit:
1–20 µg/L typical
Dissolved solids tolerance:
up to 20%
Detector:
CCD or CMOS array

A radial-view ICP-OES spectrometer observes the plasma from the side, which tolerates high dissolved solids and major elements. It is chosen for robust multi-element analysis of brines, slags and other difficult matrices.

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Axial-View ICP-OES Spectrometer

轴向观测电感耦合等离子体发射光谱仪

  • ICO-0002
  • ICP-OES
  • CE (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)
  • 21 CFR Part 11 software compliance (to be confirmed)
Wavelength range:
165–900 nm
Viewing mode:
axial
Detection limit:
0.1–2 µg/L typical
Optical resolution:
≤ 0.009 nm at 200 nm
Dissolved solids tolerance:
up to 1%
Detector:
CCD or CMOS array

An axial-view ICP-OES spectrometer observes the plasma end-on to extend the optical path. It is chosen for the lowest ultratrace detection limits in clean samples such as drinking water, purified reagents and chemicals.

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Dual-View ICP-OES Spectrometer

双向观测电感耦合等离子体发射光谱仪

  • ICO-0003
  • ICP-OES
  • CE (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)
  • 21 CFR Part 11 software compliance (to be confirmed)
Wavelength range:
165–900 nm
Viewing modes:
axial and radial, switchable
Detection limit (axial):
0.1–2 µg/L typical
Detection limit (radial):
1–20 µg/L typical
Dissolved solids tolerance:
up to 20% (radial)
Detector:
CCD or CMOS array

A dual-view ICP-OES spectrometer switches automatically between axial and radial observation for each element. It is chosen when a single instrument must handle both ultratrace and high-matrix major-element measurements in one busy laboratory.

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Simultaneous Multi-Element ICP-OES Spectrometer

多元素同时测定 ICP-OES 光谱仪

  • ICO-0004
  • ICP-OES
  • CE (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)
  • 21 CFR Part 11 software compliance (to be confirmed)
Wavelength range:
165–900 nm
Detection:
simultaneous array
Detector:
CCD or CMOS array
Simultaneous elements:
up to 70
Analysis time:
10–30 s per sample
Detection limit:
0.5–10 µg/L typical

A simultaneous ICP-OES spectrometer records many wavelengths at once with a large array detector and no scanning. It is chosen for busy high-throughput laboratories that measure large element panels in a single fast reading.

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Sequential Scanning ICP-OES Spectrometer

顺序扫描 ICP-OES 光谱仪

  • ICO-0005
  • ICP-OES
  • CE (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)
  • IEC 61010-1 safety compliance (to be confirmed)
Wavelength range:
160–900 nm
Monochromator:
scanning grating
Optical resolution:
≤ 0.01 nm at 200 nm
Detection limit:
1–20 µg/L typical
Analysis time:
30–180 s per sample
Detector:
photomultiplier

A sequential scanning ICP-OES spectrometer measures one wavelength at a time with a movable grating. It is chosen for flexible, lower-cost laboratories that need many analytical lines but fewer routine samples per hour.

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High-Resolution Echelle ICP-OES Spectrometer

高分辨率中阶梯光栅 ICP-OES 光谱仪

  • ICO-0006
  • ICP-OES
  • CE (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)
  • 21 CFR Part 11 software compliance (to be confirmed)
Wavelength range:
165–850 nm
Optical resolution:
≤ 0.005 nm at 200 nm
Detector:
large CCD or CMOS array
Dispersion:
echelle grating plus prism
Simultaneous elements:
up to 70
Detection limit:
0.5–10 µg/L typical

A high-resolution echelle ICP-OES spectrometer resolves closely spaced emission lines in composite, line-rich spectra. It is chosen for difficult rare-earth, iron-rich and similar samples where unresolved line overlap otherwise causes quantitation errors.

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Compare ICP-OES models

ModelWavelength rangeViewing modeOptical resolutionDetection limitDissolved solids tolerance
Radial-View ICP-OES SpectrometerICO-0001165–900 nmradial≤ 0.009 nm at 200 nm1–20 µg/L typicalup to 20%
Axial-View ICP-OES SpectrometerICO-0002165–900 nmaxial≤ 0.009 nm at 200 nm0.1–2 µg/L typicalup to 1%
Dual-View ICP-OES SpectrometerICO-0003165–900 nm———up to 20% (radial)
Simultaneous Multi-Element ICP-OES SpectrometerICO-0004165–900 nm—≤ 0.009 nm at 200 nm0.5–10 µg/L typical—
Sequential Scanning ICP-OES SpectrometerICO-0005160–900 nmradial or axial≤ 0.01 nm at 200 nm1–20 µg/L typical—
High-Resolution Echelle ICP-OES SpectrometerICO-0006165–850 nmaxial, radial or dual≤ 0.005 nm at 200 nm0.5–10 µg/L typical—

Indicative values for this product class. Final specifications are confirmed on the quotation and in the calibration documents supplied with the instrument.

How do ICP-OES work?

A radio-frequency generator drives a load coil around a quartz torch, sustaining an argon plasma at 6000 to 10000 K. The sample aerosol enters the plasma and is desolvated, vaporized, atomized and excited. Excited atoms and ions relax and emit light at wavelengths characteristic of each element. The emitted light is dispersed by an echelle grating or a CCD-based polychromator, and multiple lines are measured simultaneously. In radial viewing the plasma is observed from the side, which tolerates high dissolved solids and reduces self-absorption; in axial viewing the plasma is observed end-on, which lengthens the optical path and lowers detection limits. Dual-view instruments switch per element. Internal standards, background correction and interference algorithms correct for drift and overlapping lines. The wide dynamic range lets major, minor and trace elements be measured in one run.

Which ICP-OES variants are available?

  • Radial-View ICP-OES Spectrometer — A radial-view ICP-OES spectrometer observes the plasma from the side, which tolerates high dissolved solids and major elements.
  • Axial-View ICP-OES Spectrometer — An axial-view ICP-OES spectrometer observes the plasma end-on to extend the optical path.
  • Dual-View ICP-OES Spectrometer — A dual-view ICP-OES spectrometer switches automatically between axial and radial observation for each element.
  • Simultaneous Multi-Element ICP-OES Spectrometer — A simultaneous ICP-OES spectrometer records many wavelengths at once with a large array detector and no scanning.
  • Sequential Scanning ICP-OES Spectrometer — A sequential scanning ICP-OES spectrometer measures one wavelength at a time with a movable grating.
  • High-Resolution Echelle ICP-OES Spectrometer — A high-resolution echelle ICP-OES spectrometer resolves closely spaced emission lines in composite, line-rich spectra.

How do I choose the right variant?

Select an ICP-OES spectrometer by viewing configuration, detector type, resolution and automation. Radial viewing is the best choice for high-matrix samples and major elements, axial viewing for the lowest detection limits in clean samples, and dual view for laboratories that handle both. Simultaneous CCD instruments measure many elements and lines quickly, while sequential scanning instruments are flexible and lower in cost but slower. High-resolution echelle optics help when many emission lines overlap, as in rare-earth or iron-rich samples. Confirm the wavelength range covers the elements and lines you need, including far-ultraviolet lines for halogens. Check argon and power consumption, sample introduction options, autosampler capacity and software features such as interference correction and audit trails.

Where are ICP-OES used?

ICP-OES are specified in multi-element water and wastewater analysis, pharmaceutical elemental impurity screening, food, feed and agricultural element analysis and metals, alloys and geological sample assays.

Which standards and certifications apply?

Work with ICP-OES is commonly governed by USP <730> Plasma Spectrochemistry, USP <233> Elemental Impurities — Procedures, ICH Q3D Elemental Impurities, ISO 11885 Water quality — ICP-OES determination of elements, US EPA Method 200.7, ASTM D5185 and ISO/IEC 17025. Instrument certifications such as CE marking are confirmed per configuration and never assumed.

What are the key considerations before purchase?

ICP-OES requires high-purity argon, substantial power, exhaust ventilation and a temperature-controlled room. Torch, injector and nebulizer condition strongly affect performance, so inspection and replacement schedules are important. High dissolved solids cause salt build-up on the torch and injector, blocking the plasma and changing sensitivity, so dilution and matrix matching are used. Sample preparation by acid digestion must avoid contamination. Daily checks include wavelength calibration, torch alignment, plasma stability and a check standard. Monitor the argon supply and the chiller, and record torch and nebulizer usage. Data integrity requires calibration verification, QC samples and defined acceptance criteria.

Frequently asked questions about ICP-OES

Radial viewing observes a thin section of the plasma, which reduces self-absorption and tolerates high dissolved solids and major elements without saturating the detector. Axial viewing looks through the plasma length for lower detection limits in clean samples. Dual-view instruments combine both, and the operator selects the view per element.

Need help specifying ICP-OES?

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