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Radial-View ICP-OES Spectrometer — product photo

Radial-View ICP-OES Spectrometer

径向观测电感耦合等离子体发射光谱仪

  • SKU ICO-0001
  • ICP-OES
  • CE (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)
  • IEC 61010-1 safety compliance (to be confirmed)

Price on request — FOB / CIF quoted per order

Prices depend on configuration, quantity and destination port.

Key specifications

Key specifications
Wavelength range165–900 nm
Viewing moderadial
Optical resolution≤ 0.009 nm at 200 nm
Detection limit1–20 µg/L typical
Dissolved solids toleranceup to 20%
DetectorCCD or CMOS array
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By Lab Manufacturers China Technical TeamLast reviewed Standards: USP <730> Plasma Spectrochemistry, USP <233> Elemental Impurities — Procedures, ICH Q3D Elemental Impurities

What is the Radial-View ICP-OES Spectrometer?

A radial-view ICP-OES spectrometer observes the plasma from the side, which tolerates high dissolved solids and major elements. It is chosen for robust multi-element analysis of brines, slags and other difficult matrices.

What is the Radial-View ICP-OES Spectrometer?

A radial-view ICP-OES spectrometer observes the plasma from the side, which tolerates high dissolved solids and major elements. It is chosen for robust multi-element analysis of brines, slags and other difficult matrices.

Overview

In radial viewing the emitted light is collected from a narrow horizontal zone of the plasma, so only a small optical section is measured. This reduces self-absorption for intense lines and avoids detector saturation when major elements are present, which makes the configuration tolerant of samples with high salt content or percent-level analytes. Detection limits are slightly higher than axial viewing because the optical path is shorter, but the plasma is not disturbed by the full length of the discharge and the torch lifetime is often better. Radial instruments are the standard choice for metallurgical, geological and industrial samples and for methods that measure both major and trace elements in one run. Typical optics cover 165 to 900 nanometres with a CCD detector, and internal standards correct for matrix effects.

How does it work?

A radio-frequency generator drives a load coil around a quartz torch, sustaining an argon plasma at 6000 to 10000 K. The sample aerosol enters the plasma and is desolvated, vaporized, atomized and excited. Excited atoms and ions relax and emit light at wavelengths characteristic of each element. The emitted light is dispersed by an echelle grating or a CCD-based polychromator, and multiple lines are measured simultaneously. In radial viewing the plasma is observed from the side, which tolerates high dissolved solids and reduces self-absorption; in axial viewing the plasma is observed end-on, which lengthens the optical path and lowers detection limits. Dual-view instruments switch per element. Internal standards, background correction and interference algorithms correct for drift and overlapping lines. The wide dynamic range lets major, minor and trace elements be measured in one run.

What are the key features?

  • Side-on plasma observation from a narrow section
  • Tolerates high dissolved solids and percent-level elements
  • Reduced self-absorption and detector saturation
  • Typically longer torch life than axial configurations
  • CCD detection across 165 to 900 nm
  • Internal standard correction channels

What are the technical specifications?

A typical radial-view icp-oes spectrometer configuration offers wavelength range of 165–900 nm, viewing mode of radial, optical resolution of ≤ 0.009 nm at 200 nm, detection limit of 1–20 µg/L typical, dissolved solids tolerance of up to 20% and detector of CCD or CMOS array. Values are indicative of the product class; the exact figures for each configuration are confirmed on the quotation and the calibration documents supplied with the instrument.

Which applications is it used for?

The Radial-View ICP-OES Spectrometer is used in metallurgical alloys and slag analysis, geological and mining sample assays, industrial brines and process solutions and waste and soil digests with high matrix. Across the wider ICP-OES class, laboratories also deploy it for multi-element water and wastewater analysis, pharmaceutical elemental impurity screening and food, feed and agricultural element analysis.

Which standards and certifications apply?

Relevant standards and methods include USP <730> Plasma Spectrochemistry, USP <233> Elemental Impurities — Procedures, ICH Q3D Elemental Impurities, ISO 11885 Water quality — ICP-OES determination of elements, US EPA Method 200.7, ASTM D5185 and ISO/IEC 17025. Certification candidates for this model are CE, ISO 9001 manufacturing and IEC 61010-1 safety compliance; each is to be confirmed for the specific configuration before shipment, and certificates are supplied only where they have been issued.

ICP-OES requires high-purity argon, substantial power, exhaust ventilation and a temperature-controlled room. Torch, injector and nebulizer condition strongly affect performance, so inspection and replacement schedules are important. High dissolved solids cause salt build-up on the torch and injector, blocking the plasma and changing sensitivity, so dilution and matrix matching are used. Sample preparation by acid digestion must avoid contamination. Daily checks include wavelength calibration, torch alignment, plasma stability and a check standard. Monitor the argon supply and the chiller, and record torch and nebulizer usage. Data integrity requires calibration verification, QC samples and defined acceptance criteria.

How do I select the right Radial-View ICP-OES Spectrometer?

Select radial viewing when samples contain high dissolved solids, when major elements are measured alongside trace elements, or when torch and matrix robustness matter more than the lowest detection limits. Specify the element list, concentration ranges and matrices, and confirm argon and exhaust capacity for continuous operation.

How does it compare with other ICP-OES variants?

Select an ICP-OES spectrometer by viewing configuration, detector type, resolution and automation. Radial viewing is the best choice for high-matrix samples and major elements, axial viewing for the lowest detection limits in clean samples, and dual view for laboratories that handle both. Simultaneous CCD instruments measure many elements and lines quickly, while sequential scanning instruments are flexible and lower in cost but slower. High-resolution echelle optics help when many emission lines overlap, as in rare-earth or iron-rich samples. Confirm the wavelength range covers the elements and lines you need, including far-ultraviolet lines for halogens. Check argon and power consumption, sample introduction options, autosampler capacity and software features such as interference correction and audit trails.

Full specifications

Full specifications
Wavelength range165–900 nm
Viewing moderadial
Optical resolution≤ 0.009 nm at 200 nm
Detection limit1–20 µg/L typical
Dissolved solids toleranceup to 20%
DetectorCCD or CMOS array
RF power1000–1500 W
Argon consumption12–18 L/min
Sample introductionconcentric or V-groove nebulizer
Simultaneous elementsup to 70

Indicative values for this product class. Final specifications are confirmed on the quotation and in the calibration documents supplied with the instrument.

Applications

  • Metallurgical alloys and slag analysis
  • Geological and mining sample assays
  • Industrial brines and process solutions
  • Waste and soil digests with high matrix

Key features

  • Side-on plasma observation from a narrow section
  • Tolerates high dissolved solids and percent-level elements
  • Reduced self-absorption and detector saturation
  • Typically longer torch life than axial configurations
  • CCD detection across 165 to 900 nm
  • Internal standard correction channels

Frequently asked questions about Radial-View ICP-OES Spectrometer

Because only a narrow section of the plasma is imaged, salt deposition and matrix changes in other regions affect the measurement less, and strong lines are not compressed by the full plasma length. The shorter path also reduces self-absorption, so percent-level elements remain on scale.

Related models

All ICP-OES

Request a quotation for the Radial-View ICP-OES Spectrometer

Send your configuration, quantity and destination port to sales@labmanufacturerschina.com; we reply with a specification sheet and price.

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