

Axial-View ICP-OES Spectrometer
轴向观测电感耦合等离子体发射光谱仪
- SKU ICO-0002
- ICP-OES
- CE (to be confirmed)
- ISO 9001 manufacturing (to be confirmed)
- 21 CFR Part 11 software compliance (to be confirmed)
Price on request — FOB / CIF quoted per order
Prices depend on configuration, quantity and destination port.
Key specifications
| Wavelength range | 165–900 nm |
|---|---|
| Viewing mode | axial |
| Detection limit | 0.1–2 µg/L typical |
| Optical resolution | ≤ 0.009 nm at 200 nm |
| Dissolved solids tolerance | up to 1% |
| Detector | CCD or CMOS array |
By Lab Manufacturers China Technical TeamLast reviewed Standards: USP <730> Plasma Spectrochemistry, USP <233> Elemental Impurities — Procedures, ICH Q3D Elemental Impurities
What is the Axial-View ICP-OES Spectrometer?
An axial-view ICP-OES spectrometer observes the plasma end-on to extend the optical path. It is chosen for the lowest ultratrace detection limits in clean samples such as drinking water, purified reagents and chemicals.
What is the Axial-View ICP-OES Spectrometer?
An axial-view ICP-OES spectrometer observes the plasma end-on to extend the optical path. It is chosen for the lowest ultratrace detection limits in clean samples such as drinking water, purified reagents and chemicals.
Overview
Axial viewing looks along the length of the plasma, so the emitted light travels through a much longer region of excited atoms before reaching the optics. This gives substantially lower detection limits than radial viewing, often by a factor of five to ten for many elements. The trade-off is greater self-absorption and matrix effects, because the entire plasma contributes to the signal, and a shear gas or cooled cone interface is used to protect the torch and reduce thermal effects. High dissolved solids and percent-level elements can saturate the detector, so dilution or a switch to radial viewing is required. Axial instruments excel for trace analysis of drinking water, ultrapure chemicals, food digests and pharmaceutical solutions, where the matrix is low and the lowest possible limits matter.
How does it work?
A radio-frequency generator drives a load coil around a quartz torch, sustaining an argon plasma at 6000 to 10000 K. The sample aerosol enters the plasma and is desolvated, vaporized, atomized and excited. Excited atoms and ions relax and emit light at wavelengths characteristic of each element. The emitted light is dispersed by an echelle grating or a CCD-based polychromator, and multiple lines are measured simultaneously. In radial viewing the plasma is observed from the side, which tolerates high dissolved solids and reduces self-absorption; in axial viewing the plasma is observed end-on, which lengthens the optical path and lowers detection limits. Dual-view instruments switch per element. Internal standards, background correction and interference algorithms correct for drift and overlapping lines. The wide dynamic range lets major, minor and trace elements be measured in one run.
What are the key features?
- End-on observation along the plasma length
- Lower detection limits than radial viewing
- Shear gas or cooled interface to protect the torch
- Best for low-matrix trace analysis
- Requires dilution for high-matrix samples
- CCD detection with internal standard correction
What are the technical specifications?
A typical axial-view icp-oes spectrometer configuration offers wavelength range of 165–900 nm, viewing mode of axial, detection limit of 0.1–2 µg/L typical, optical resolution of ≤ 0.009 nm at 200 nm, dissolved solids tolerance of up to 1% and detector of CCD or CMOS array. Values are indicative of the product class; the exact figures for each configuration are confirmed on the quotation and the calibration documents supplied with the instrument.
Which applications is it used for?
The Axial-View ICP-OES Spectrometer is used in trace metals in drinking water, pharmaceutical and ultrapure chemical analysis, food and beverage trace element testing and environmental water with low matrix. Across the wider ICP-OES class, laboratories also deploy it for multi-element water and wastewater analysis, pharmaceutical elemental impurity screening and food, feed and agricultural element analysis.
Which standards and certifications apply?
Relevant standards and methods include USP <730> Plasma Spectrochemistry, USP <233> Elemental Impurities — Procedures, ICH Q3D Elemental Impurities, ISO 11885 Water quality — ICP-OES determination of elements, US EPA Method 200.7, ASTM D5185 and ISO/IEC 17025. Certification candidates for this model are CE, ISO 9001 manufacturing and 21 CFR Part 11 software compliance; each is to be confirmed for the specific configuration before shipment, and certificates are supplied only where they have been issued.
ICP-OES requires high-purity argon, substantial power, exhaust ventilation and a temperature-controlled room. Torch, injector and nebulizer condition strongly affect performance, so inspection and replacement schedules are important. High dissolved solids cause salt build-up on the torch and injector, blocking the plasma and changing sensitivity, so dilution and matrix matching are used. Sample preparation by acid digestion must avoid contamination. Daily checks include wavelength calibration, torch alignment, plasma stability and a check standard. Monitor the argon supply and the chiller, and record torch and nebulizer usage. Data integrity requires calibration verification, QC samples and defined acceptance criteria.
How do I select the right Axial-View ICP-OES Spectrometer?
Select axial viewing when the lowest detection limits are required and samples are low in dissolved solids, such as drinking water, purified reagents or digested food. Specify the elements, target limits and matrices. For samples that vary widely in matrix, a dual-view instrument may be more practical than a fixed axial configuration.
How does it compare with other ICP-OES variants?
Select an ICP-OES spectrometer by viewing configuration, detector type, resolution and automation. Radial viewing is the best choice for high-matrix samples and major elements, axial viewing for the lowest detection limits in clean samples, and dual view for laboratories that handle both. Simultaneous CCD instruments measure many elements and lines quickly, while sequential scanning instruments are flexible and lower in cost but slower. High-resolution echelle optics help when many emission lines overlap, as in rare-earth or iron-rich samples. Confirm the wavelength range covers the elements and lines you need, including far-ultraviolet lines for halogens. Check argon and power consumption, sample introduction options, autosampler capacity and software features such as interference correction and audit trails.
Full specifications
| Wavelength range | 165–900 nm |
|---|---|
| Viewing mode | axial |
| Detection limit | 0.1–2 µg/L typical |
| Optical resolution | ≤ 0.009 nm at 200 nm |
| Dissolved solids tolerance | up to 1% |
| Detector | CCD or CMOS array |
| RF power | 1000–1500 W |
| Argon consumption | 14–20 L/min |
| Interface | shear gas or cooled cone |
| Simultaneous elements | up to 70 |
Indicative values for this product class. Final specifications are confirmed on the quotation and in the calibration documents supplied with the instrument.
Applications
- Trace metals in drinking water
- Pharmaceutical and ultrapure chemical analysis
- Food and beverage trace element testing
- Environmental water with low matrix
Key features
- End-on observation along the plasma length
- Lower detection limits than radial viewing
- Shear gas or cooled interface to protect the torch
- Best for low-matrix trace analysis
- Requires dilution for high-matrix samples
- CCD detection with internal standard correction
Frequently asked questions about Axial-View ICP-OES Spectrometer
For many elements axial viewing lowers detection limits by roughly five to ten times compared with radial viewing, because the optical path through the plasma is much longer. The exact improvement depends on the element, line and matrix, and it shrinks when self-absorption or background is high.
The plasma tail extends toward the optics in an axial configuration, so the torch and interface would overheat and deposits would form. A shear gas or cooled cone deflects the hot plasma tail and protects the optical components, extending torch life and keeping the view stable.
It can, but intense lines may saturate the detector and self-absorption compresses the calibration curve. Analysts either dilute the sample, choose a weaker line or switch to radial viewing. Dual-view instruments make this choice automatic by selecting the view per element.
Radial viewing observes a thin section of the plasma, which reduces self-absorption and tolerates high dissolved solids and major elements without saturating the detector. Axial viewing looks through the plasma length for lower detection limits in clean samples. Dual-view instruments combine both, and the operator selects the view per element.
Excited atoms and ions have many energy levels, so each element emits numerous lines, some strong and some weak. The analyst selects a line free from overlap and within the working range for the expected concentration. Weak lines suit high concentrations, and strong lines suit trace levels.
Yes, in principle, using far-ultraviolet emission lines, for example chlorine at 134.7 and 135.2 nanometres, bromine and iodine lines, and sulfur and phosphorus lines. These lines require a vacuum or purged optical path because air absorbs far-ultraviolet light. Sensitivity is lower than for metals, and ICP-MS may be preferred.




