Skip to main content
Lab Manufacturers China
Laser-Induced Breakdown Spectroscopy Soil Analyzer — product photo

Laser-Induced Breakdown Spectroscopy Soil Analyzer

激光诱导击穿光谱土壤分析仪

  • SKU SOS-0004
  • Soil Spectrometers
  • CE (to be confirmed)
  • Laser class safety compliance (to be confirmed)
  • ISO 9001 manufacturing (to be confirmed)

Price on request — FOB / CIF quoted per order

Prices depend on configuration, quantity and destination port.

Key specifications

Key specifications
Measurement principleLaser-induced breakdown spectroscopy
Element rangeMajor and minor metals, some light elements
Detection limit10–500 mg/kg typical
LaserNd:YAG, 1064 nm, 1–100 mJ
Spectral range190–900 nm
Spot size50–500 µm
Request a quote Download brochure · to be provided

By Lab Manufacturers China Technical TeamLast reviewed Standards: US EPA Method 6200, ISO 18227 (XRF elemental composition), ISO 13196 (EDXRF screening)

What is the Laser-Induced Breakdown Spectroscopy Soil Analyzer?

An analyzer that vaporises a small spot of soil with a laser and reads the emitted atomic lines. It is the right choice for rapid multi-element profiling and depth analysis with minimal sample preparation.

What is the Laser-Induced Breakdown Spectroscopy Soil Analyzer?

An analyzer that vaporises a small spot of soil with a laser and reads the emitted atomic lines. It is the right choice for rapid multi-element profiling and depth analysis with minimal sample preparation.

Overview

The laser-induced breakdown spectroscopy analyzer focuses a pulsed laser onto the soil surface to create a short-lived plasma, in which atoms emit light at characteristic wavelengths that a spectrometer records. Because each laser pulse removes only a tiny amount of material, the technique can measure element profiles with depth by firing repeated pulses at the same point, which is useful for layered or contaminated surfaces. It measures metallic elements and some light elements that XRF handles poorly, and sample preparation can be minimal, though pressing the soil into a pellet improves repeatability. Detection limits are generally higher than XRF or ICP, so LIBS is used for screening, sorting, mapping and process control rather than trace determination, and quantification relies on calibration against reference materials. The method is fast and can be deployed in portable or benchtop formats.

How does it work?

Soil spectrometers use several spectroscopic principles. X-ray fluorescence excites atoms in the sample with X-rays, and each element emits characteristic fluorescence that an energy-dispersive detector identifies, giving elemental concentrations from sodium to uranium with little sample preparation. Portable instruments bring this capability to the field, while benchtop units give lower detection limits and better precision. Laser-induced breakdown spectroscopy focuses a laser to create a small plasma on the sample surface and reads the emitted atomic lines, which allows rapid multi-element measurement with minimal preparation. Visible and near-infrared and mid-infrared spectrometers measure diffuse reflectance, where overtones and combination bands of soil constituents such as clay minerals, carbonates, organic matter and water provide predictions through calibration models.

What are the key features?

  • Pulsed laser creates plasma for atomic emission analysis.
  • Minimal sample preparation required.
  • Depth profiling by repeated pulses at one point.
  • Measures metallic and some light elements.
  • Portable and benchtop formats available.
  • Fast measurement suits sorting and mapping.

What are the technical specifications?

A typical laser-induced breakdown spectroscopy soil analyzer configuration offers measurement principle of Laser-induced breakdown spectroscopy, element range of Major and minor metals, some light elements, detection limit of 10–500 mg/kg typical, laser of Nd:YAG, 1064 nm, 1–100 mJ, spectral range of 190–900 nm and spot size of 50–500 µm. Values are indicative of the product class; the exact figures for each configuration are confirmed on the quotation and the calibration documents supplied with the instrument.

Which applications is it used for?

The Laser-Induced Breakdown Spectroscopy Soil Analyzer is used in rapid multi-element soil screening, depth profiling of contaminated surfaces, mine and drill core characterisation and in-situ mapping and sorting. Across the wider Soil Spectrometers class, laboratories also deploy it for contaminated site screening, mining and geochemical exploration and precision agriculture soil mapping.

Which standards and certifications apply?

Relevant standards and methods include US EPA Method 6200, ISO 18227 (XRF elemental composition), ISO 13196 (EDXRF screening), ISO 17184 (NIR carbon and nitrogen) and ISO 10694 (organic carbon). Certification candidates for this model are CE, Laser class safety compliance and ISO 9001 manufacturing; each is to be confirmed for the specific configuration before shipment, and certificates are supplied only where they have been issued.

Prepare samples consistently, because moisture, particle size, surface roughness and compaction all affect spectroscopic readings. For XRF, dry and grind the soil, use a thin sample over a support or a pressed pellet, and account for the sample matrix through calibration, fundamental parameters or a standard addition approach, since the method is comparative rather than absolute. For infrared methods, standardise drying and grinding and control temperature, because water dominates the spectra. Run certified reference materials, duplicates and blanks with each batch and verify calibration curves periodically. For XRF, comply with radiation safety requirements, including licensing, training, dosimetry, a radiation survey and secure storage. Record sample preparation, instrument settings and calibration used, and confirm important results with a laboratory reference method.

How do I select the right Laser-Induced Breakdown Spectroscopy Soil Analyzer?

Select LIBS for rapid screening, depth profiling and sorting where minimal preparation and speed matter and detection limits of tens of milligrams per kilogram are acceptable. For trace or reference analysis, use XRF, ICP or laboratory methods. In an RFQ, specify target elements, laser class and whether depth profiling is required.

How does it compare with other Soil Spectrometers variants?

Choose according to the target, the required detection limit and the portability needed. Portable XRF is the first choice for heavy metal screening and contamination mapping in the field, because it measures many elements directly with minimal preparation; it is less suited to light elements and to some elements that need very low detection limits. Benchtop XRF or inductively coupled plasma techniques are used for reference confirmation. Laser-induced breakdown spectroscopy suits rapid multi-element profiling and depth analysis with minimal sample handling but has higher detection limits. Visible-near-infrared and mid-infrared are used for organic matter, carbonate, clay and sometimes nutrient predictions, and depend entirely on a local calibration library. Consider radiation licensing for XRF, calibration and reference sample support, and whether the technique provides screening or reference data.

Full specifications

Full specifications
Measurement principleLaser-induced breakdown spectroscopy
Element rangeMajor and minor metals, some light elements
Detection limit10–500 mg/kg typical
LaserNd:YAG, 1064 nm, 1–100 mJ
Spectral range190–900 nm
Spot size50–500 µm
Depth resolutionA few µm per pulse
Measurement time1–30 s per point
Sample preparationMinimal, pellet preferred
Power supply220 VAC or battery
SafetyClass 4 laser interlock and eyewear

Indicative values for this product class. Final specifications are confirmed on the quotation and in the calibration documents supplied with the instrument.

Applications

  • Rapid multi-element soil screening
  • Depth profiling of contaminated surfaces
  • Mine and drill core characterisation
  • In-situ mapping and sorting

Key features

  • Pulsed laser creates plasma for atomic emission analysis.
  • Minimal sample preparation required.
  • Depth profiling by repeated pulses at one point.
  • Measures metallic and some light elements.
  • Portable and benchtop formats available.
  • Fast measurement suits sorting and mapping.

Frequently asked questions about Laser-Induced Breakdown Spectroscopy Soil Analyzer

Each laser pulse ablates a thin layer of material, so firing a series of pulses at the same point and recording the spectrum after each gives elemental composition as a function of depth. This reveals surface contamination versus subsurface concentrations.

Portable XRF Soil Analyzer — product photo

Portable XRF Soil Analyzer

便携式 X 射线荧光土壤分析仪

  • CE (to be confirmed)
  • +2
Request a quote

Request a quotation for the Laser-Induced Breakdown Spectroscopy Soil Analyzer

Send your configuration, quantity and destination port to sales@labmanufacturerschina.com; we reply with a specification sheet and price.

Request a quote